Patents/Inventors

Christina Lynn Porter

VeldhovenNL1 patent

2 Patents

US124742672025
Wavefront Metrology Sensor and Mask Therefor, Method for Optimizing a Mask and Associated Apparatuses
ASML Netherlands B.V.
0 cites
US120449512024
Illumination Source and Associated Metrology Apparatus
ASML Netherlands B.V.
0 cites