Christian Wojek

6 Patents

• US123073342025

  Method and Device for Evaluating a Statistically Distributed Measured Value in the Examination of an Element of a Photolithography Process

  Carl Zeiss SMT GmbH

  0 cites
• US121756502024

  Processing Image Data Sets

  Carl Zeiss SMT GmbH

  0 cites
• US121355402024

  Devices and Methods for Examining And/or Processing an Element for Photolithography

  Carl Zeiss SMT GmbH

  0 cites
• US120459692024

  Automated Root Cause Analysis for Defect Detection During Fabrication Processes of Semiconductor Structures

  Carl Zeiss SMT GmbH

  0 cites
• US120087082024

  Method and Data Processing System for Creating or Adapting Individual Images Based on Properties of a Light Ray Within a Lens

  Carl Zeiss AG

  0 cites
• US117281302023

  Method of Recording an Image Using a Particle Microscope

  Carl Zeiss SMT GmbH

  0 cites