Chosaku Noda

3 Patents

• US123548312025

  Pattern Inspection Apparatus and Pattern Inspection Method

  Nuflare Technology, Inc.

  0 cites
• US122886662025

  Multiple Electron Beam Image Acquisition Method, Multiple Electron Beam Image Acquisition Apparatus, and Multiple Electron Beam Inspection Apparatus

  Nuflare Technology, Inc.

  0 cites
• US119617032024

  Multiple Electron-beam Image Acquisition Apparatus and Multiple Electron-beam Image Acquisition Method Using Beam Arrangement with Omitted Corners in a Scan Direction

  Nuflare Technology, Inc.

  0 cites