Patents/Inventors

Choon Leong Lou

SingaporeSG29 patents

23 Patents

US126219292026
Elastic Interposer and Conductive Device Thereof
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
0 cites
US125849572026
Wafer Testing Cassette
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
0 cites
US125044432025
Probe Card Structure Including Probe Sets with Different Lengths
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US124983972025
Probe Card and Thermal Conduction Device Thereof
STAR TECHNOLOGIES, Inc.
0 cites
US124679542025
Probe Card Device
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US124679512025
Probe Device
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US124052902025
Probe Testing Device Having Elastic Structure
STAR TECHNOLOGIES (WUHAN) CO., Ltd.
0 cites
US123457592025
Guide Plate Structure Having Guide Plates with Through Holes and Probe Array Having Guide Plate Structure
XINGR HOLDINGS PTE. Ltd.
0 cites
US122551132025
Alignment Method and Alignment Device
STAR TECHNOLOGIES (WUHAN) CO., Ltd.
0 cites
US122100372025
Probe Array and Probe Structure
VUETTE PTE. Ltd.
0 cites
US121639802024
Probe and Elastic Structure Thereof
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US121174842024
Test Device
Tecat Technologies (Suzhou) Limited
0 cites
US121115052024
Light Guiding Device and Light Guiding Device Applied to Silicon Photonics Structure
STAR TECHNOLOGIES (WUHAN) CO., Ltd.
0 cites
US119659122024
Probe Card Device Having a Probe Structure with a Protrusion Portion
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
0 cites
US119535182024
Switching Matrix System and Operating Method Thereof for Semiconductor Characteristic Measurement
STAR TECHNOLOGIES, Inc.
0 cites
US118799132024
Probe Card Structure
XINZHUO TECHNOLOGY (ZHEJIANG) CO., Ltd.
0 cites
US118287892023
Test Apparatus and Jumper Thereof
STAR TECHNOLOGIES, Inc.
0 cites
US118044172023
Semiconductor Structure Comprising Heat Dissipation Member
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US117682232023
Testing Device and Probe Elements Thereof
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US117619842023
Probe Card Device and Testing Equipment Thereof
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US117546192023
Probing Apparatus with Temperature-adjusting Mechanism
STAR TECHNOLOGIES, Inc.
0 cites
US115671042023
High Speed Signal Transmitting and Receiving Detection Device
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites
US115499682023
Probing System
TECAT TECHNOLOGIES (SUZHOU) LIMITED
0 cites