Ching-nen Peng

3 Patents

• US118526722023

  Test Circuit and Method

  TAIWAN SEMICONDUCTORMANUFACTURING COMPANY LIMITED

  0 cites
• US117261122023

  Electromagnetic Shielding During Wafer Stage Testing

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US115791902023

  Testing Holders for Chip Unit and Die Package

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites