18 Patents
- US124865662025Physical Vapor Deposition Chamber with Target Surface Morphology Monitor
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US124083542025Method to Reduce Breakdown Failure in a MIM Capacitor
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122611972025Diffusion Barrier Layer in Top Electrode to Increase Break Down Voltage
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122390352025Resistive Memory Cell Having a Low Forming Voltage
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121990292025MIM Capacitor with a Symmetrical Capacitor Insulator Structure
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121781472024Semiconductor Device and Method for Manufacturing the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US121610572024Method for Forming Semiconductor Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - 0 cites
- US121007672024Strained Gate Semiconductor Device Having an Interlayer Dielectric Doped with Large Species Material
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US121020192024Data Storage Structure for Improving Memory Cell Reliability
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US119232352024Method for Forming Semiconductor Device Having Isolation Structures with Different Thicknesses
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US117217942023Method for Manufacturing Reflective Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US117169132023Data Storage Structure for Improving Memory Cell Reliability
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US116372402023Semiconductor Structure and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US115945932023Method to Reduce Breakdown Failure in a MIM Capacitor
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites