Patents/Inventors

Chih-yu Jen

San Jose, CAUS3 patents

3 Patents

US125675582026
Systems and Methods for Pulsed Voltage Contrast Detection and Capture of Charging Dynamics
ASML Netherlands B.V.
0 cites
US124696742025
Photo-electrical Evolution Defect Inspection
ASML Netherlands B.V.
0 cites
US116519352023
Time-dependent Defect Inspection Apparatus
ASML Netherlands B.V.
0 cites