Cheng-jer Yang

11 Patents

• US123411322025

  Semiconductor Structure

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US122939792025

  Memory Structure Including Elastic Material Based Buffer Column Structure Near Contact Structure to Improve Stability of Connection

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US120336912024

  Readout Circuit Layout Structure, Readout Circuit, and Memory Layout Structure

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US119291322024

  Testing Method, Testing System, and Testing Apparatus for Semiconductor Chip

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US118925022024

  Through-silicon via (TSV) Fault-tolerant Circuit, Method for TSV Fault-tolerance and Integrated Circuit (IC)

  Changxin Memory Technologies, Inc.

  0 cites
• US118867332024

  Circuit for Testing a Memory and Test Method Thereof

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US118695762024

  Word Line Driving Circuit and Dynamic Random Access Memory

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US118622692024

  Testing Method for Packaged Chip, Testing System for Packaged Chip, Computer Device and Storage Medium

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US118305532023

  Word Line Drive Circuit and Dynamic Random Access Memory

  CHANGXIN MEMORY TECHNOLOGIES, Inc.

  0 cites
• US117155432023

  Memory Test Circuit Apparatus and Test Method

  Changxin Memory Technologies, Inc.

  0 cites
• US116144812023

  Through-silicon via Detecting Circuit, Detecting Methods and Integrated Circuit Thereof

  Changxin Memory Technologies, Inc.

  0 cites