6 Patents
- US126045522026Contact Etch Stop Layer for a Pixel Sensor
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122596602025Inspection Method and Inspection Platform for Lithography
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites - US120947562024Semiconductor Arrangement Comprising Isolation Structure Comprising at Least Two Electrical Insulator Layers
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
0 cites - US120466152024Semiconductor Device Including Deep Trench Isolation Structure Comprising Dielectric Structure and Copper Structure and Method of Making the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
0 cites - US118218472023Wafer Backside Defect Detection Method and Wafer Backside Defect Detection Apparatus
UNITED MICROELECTRONICS Corp.
0 cites - US115629232023Semiconductor Arrangement Including a First Electrical Insulator Layer and a Second Electrical Insulator Layer and Method of Making
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites