Patents/Inventors

Chen Min Lin

KeelungTW1 patent

2 Patents

US122495262025
Detecting Damaged Semiconductor Wafers Utilizing a Semiconductor Wafer Sorter Tool of an Automated Materials Handling System
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US116005042023
Detecting Damaged Semiconductor Wafers Utilizing a Semiconductor Wafer Sorter Tool of an Automated Materials Handling System
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites