5 Patents
- 0 cites
- US125105902025Metrology in the Presence of CMOS Under Array (cua) Structures Utilizing an Effective Medium Model with Physical Modeling
KLA Corporation
0 cites - US123803672025Metrology in the Presence of CMOS Under Array (cua) Structures Utilizing Machine Learning and Physical Modeling
KLA Corporation
0 cites - US123728822025Metrology in the Presence of CMOS Under Array (CUA) Structures Utilizing an Effective Medium Model with Classification of CUA Structures
KLA Corporation
0 cites - US115574622023Collecting and Recycling Rare Gases in Semiconductor Processing Equipment
KLA CORPORATION
0 cites