20 Patents
- 0 cites
- 0 cites
- 0 cites
- US120573362024Estimating Heights of Defects in a Wafer by Scaling a 3D Model Using an Artificial Neural Network
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- US116100972023Apparatus and Method for Generating Sampling Model for Uncertainty Prediction, and Apparatus for Predicting Uncertainty
Hodooal Lab Inc.
0 cites - 0 cites