Patents/Inventors

Changhoon Choi

Suwon-siKR13 patents

12 Patents

US125931382026
Image Signal Processor and Method of Processing Images
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125617882026
Fluorescence Microscopy Metrology System and Method of Operating Fluorescence Microscopy Metrology System
IUCF-HYU (Industry-university Cooperation Foundation Hanyang University)
0 cites
US124811442025
EUV Photomask Inspection Apparatus
Samsung Electronics Co., Ltd.
0 cites
US123007112025
Integrated Sensor for Lifetime Characterization
Quantum-si Incorporated
0 cites
US122038552025
Sensor for Lifetime Plus Spectral Characterization
Quantum-si Incorporated
0 cites
US121888702025
Integrated Sensor with Reduced Skew
Quantum-si Incorporated
0 cites
US120925792024
Integrated Sensor with Reduced Skew
Quantum-si Incorporated
0 cites
US120450092024
Digital Holography Microscope (DHM), and Inspection Method and Semiconductor Manufacturing Method Using the DHM
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118857442024
Sensor for Lifetime Plus Spectral Characterization
Quantum-si Incorporated
0 cites
US118699172024
Integrated Sensor for Lifetime Characterization
Quantum-si Incorporated
0 cites
US117196392023
Integrated Sensor for Multi-dimensional Signal Analysis
Quantum-si Incorporated
0 cites
US115731802023
Integrated Sensor with Reduced Skew
Quantum-si Incorporated
0 cites