Patents/Inventors

Changgon Kim

Suwon-siKR1 patent

2 Patents

US123336962025
Electronic Device for Detecting Defect in Image on Basis of Difference Among Sub-images Acquired by Multiple Photodiode Sensors, and Operation Method Thereof
Samsung Electronics Co., Ltd.
0 cites
US120693942024
Depth Map Determination Method and Electronic Device to Which Same Method Is Applied
Samsung Electronics Co., Ltd.
0 cites