13 Patents
- 0 cites
- 0 cites
- US122374172025Finfet Device and Method of Forming and Monitoring Quality of the Same
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US122182162025Method for Manufacturing Semiconductor Devices Having Gate Spacers with Bottom Portions Recessed in a Fin
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US121258912024Semiconductor Device Having Gate Spacers Extending Below a Fin Top Surface
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US120028712024Semiconductor Device Structure with Work Function Layer and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119731442024Method of Manufacturing a Semiconductor and a Semiconductor Device
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US118548252023Gate Structure of Semiconductor Device and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - 0 cites
- US117840552023Method of Forming Semiconductor Device with Fin Isolation
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US117217622023Fin Field Effect Transistor (finfet) Device and Method for Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites