Chang-wei Chen

2 Patents

• US118109342023

  Image Sensors Including Insulating Layers in Different Pixel Regions Having Different Thicknesses and Methods for Forming the Same

  VISERA TECHNOLOGIES COMPANY LIMITED

  0 cites
• US117969782023

  Method for Determining Root Causes of Events of a Semiconductor Manufacturing Process and for Monitoring a Semiconductor Manufacturing Process

  ASML NETHERLANDS B.V.

  0 cites