Patents/Inventors

Chang-mao Wang

TainanTW2 patents

3 Patents

US122116992025
Method of Removing Step Height on Gate Structure
UNITED MICROELECTRONICS Corp.
0 cites
US121471632024
Method for Correcting Critical Dimension Measurements of Lithographic Tool
UNITED MICROELECTRONICS Corp.
0 cites
US121069622024
Patterning Method and Overlay Measurement Method
United Microelectronics Corp.
0 cites