Chandan Gupta

2 Patents

• US125539462026

  System and Method for Generating Clock Pulses for At-speed Testing of Integrated Circuits

  NXP B.V.

  0 cites
• US124224822025

  Apparatuses and Methods for Faciliatating a Dynamic Clock Frequency for At-speed Testing

  NXP B.V.

  0 cites