Patents/Inventors

Chan Hwang

Suwon-siKR12 patents

10 Patents

US125936602026
Method of Manufacturing Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125851992026
Overlay Correction Method, and Exposure Method and Semiconductor Device Manufacturing Method Including Overlay Correction Method
Samsung Electronics Co., Ltd.
0 cites
US125720842026
Methods of Determining Overlayer Reference Wavelength
Samsung Electronics Co., Ltd.
0 cites
US124513522025
Method for Fabricating Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US123004902025
Method of Manufacturing Integrated Circuit Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119602122024
Extreme Ultraviolet Lithography Device and Method of Operating Extreme Ultraviolet Lithography Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119214212024
Overlay Correcting Method, and Photolithography Method, Semiconductor Device Manufacturing Method and Scanner System Based on the Overlay Correcting Method
Samsung Electronics Co., Ltd.
0 cites
US118068192023
Fixture for Laser Engraving Long Heavy Objects
Supernova International Inc.
0 cites
US117336012023
EUV Photomask and Method of Forming Mask Pattern Using the Same
Samsung Electronics Co., Ltd.
0 cites
US116356972023
Semiconductor Device Manufacturing System
SAMSUNG ELECTRONICS CO., Ltd.
0 cites