4 Patents
- US124889572025Crenellated Sample Holder and Sputter Target for Sample Preparation in Cryo Electron Microscopy Applications
FEI Company
0 cites - 0 cites
- US117354042023Method, Device and System for the Treatment of Biological Cryogenic Samples by Plasma Focused Ion Beams
FEI Company
0 cites - US116519242023Method of Producing Microrods for Electron Emitters, and Associated Microrods and Electron Emitters
FEI Company
0 cites