12 Patents
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- US123073342025Method and Device for Evaluating a Statistically Distributed Measured Value in the Examination of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites - US121194122024Semiconductor Vertical Schottky Diode and Method of Manufacturing Thereof
LFOUNDRY S.R.L.
0 cites - US121115792024Method and Apparatus for Evaluating an Unknown Effect of Defects of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites - US120481662024Hall Integrated Circuit and Corresponding Method of Manufacturing of a Hall Integrated Circuit Using Wafer Stacking
LFOUNDRY S.R.L.
0 cites - US120011452024Apparatus and Method for Analyzing an Element of a Photolithography Process with the Aid of a Transformation Model
Carl Zeiss SMT GmbH
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- US117748592023Method and Apparatus for Evaluating an Unknown Effect of Defects of an Element of a Photolithography Process
Carl Zeiss SMT GmbH
0 cites - US116311682023Method, Computer Program and Apparatus for Determining a Quality of a Mask of a Photolithography Apparatus
Carl Zeiss SMT GmbH
0 cites - US116204292023Method and Device for Superimposing at Least Two Images of a Photolithographic Mask
Carl Zeiss SMT GmbH
0 cites - US115813982023Method of Fabrication of an Integrated Spiral Inductor Having Low Substrate Loss
LFOUNDRY S.R.L
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