Patents/Inventors

Carmel Yehuda Drillman

HaifaIL3 patents

4 Patents

US123207572025
Semiconductor Inspection Tool System and Method for Wafer Edge Inspection
CAMTEK Ltd
0 cites
US123152062025
Inspection System for Edge and Bevel Inspection of Semiconductor Structures
CAMTEK Ltd
0 cites
US119275452024
Semiconductor Edge and Bevel Inspection Tool System
CAMTEK Ltd
0 cites
US118287132023
Semiconductor Inspection Tool System and Method for Wafer Edge Inspection
CAMTEK Ltd
0 cites