8 Patents
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- US120791472024Memory Device for Efficiently Determining Whether to Perform Re-training Operation and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US120738982024Nonvolatile Memory Including On-die-termination Circuit and Storage Device Including the Nonvolatile Memory
SAMSUNG ELECTRONICS CO., Ltd.
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- US117420402023Nonvolatile Memory Including On-die-termination Circuit and Storage Device Including the Nonvolatile Memory
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US116047142023Memory Device for Efficiently Determining Whether to Perform Re-training Operation and Memory System Including the Same
Samsung Electronics Co, Ltd.
0 cites - US116005392023Defect Detection Structure of a Semiconductor Die, Semiconductor Device Including the Same and Method of Detecting Defects in Semiconductor Die
Samsung Electronics Co., Ltd.
0 cites