Patents/Inventors

Byoung-woon Ahn

Anyang-siKR4 patents

4 Patents

US123991952025
Method for Measuring, by Measurement Device, Characteristics of Surface of Object to Be Measured, Atomic Force Microscope for Performing Same Method, and Computer Program Stored in Storage Medium to Perform Same Method
PARK SYSTEMS Corp.
0 cites
US120384552024
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
PARK SYSTEMS Corp.
0 cites
US116196492023
Atomic Force Microscope Equipped with Optical Measurement Device and Method of Acquiring Information on Surface of Measurement Target Using the Same
PARK SYSTEMS Corp.
0 cites
US115987882023
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
PARK SYSTEMS Corp.
0 cites