Byeong Cheol Lee

7 Patents

• US125734662026

  Semiconductor Device for Detecting Defect in Word Line Driver

  SK Hynix Inc.

  0 cites
• US124759622025

  Semiconductor Device Providing a Test Mode Related to Detecting a Defect in a Metal Line

  SK Hynix Inc.

  0 cites
• USD10871942025

  Artificial Intelligence Robot

  Kia Corporation

  0 cites
• US123150992025

  Method and Apparatus for Displaying Translucent Image

  MEDICALIP CO., Ltd.

  0 cites
• US121051382024

  Test Socket

  LEENO INDUSTRIAL Inc.

  0 cites
• US118812492024

  Power Control Circuit, Semiconductor Apparatus Including the Same and Power Control Method of Semiconductor Apparatus

  SK Hynix Inc.

  0 cites
• US117943332023

  Joint Structure for Robot and Robot Including Same

  Kia Corporation

  0 cites