Patents/Inventors

Bruce H. Newcome

Sunnyvale, CAUS2 patents

3 Patents

US121658632024
Systems and Approaches for Semiconductor Metrology and Surface Analysis Using Secondary Ion Mass Spectrometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites
US119962592024
Patterned X-ray Emitting Target
NOVA MEASURING INSTRUMENTS Inc.
0 cites
US117640502023
Systems and Approaches for Semiconductor Metrology and Surface Analysis Using Secondary Ion Mass Spectrometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites