Patents/Inventors

Bruce A. Liikanen

Berthoud, COUS47 patents

51 Patents

US125666712026
Memory Device with Dynamic Processing Level Calibration
Micron Technology, Inc.
0 cites
US124825302025
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US124230132025
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US124242882025
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122930992025
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US122654472025
Memory Sub-system with Dynamic Calibration Using Component-based Function(s)
Micron Technology, Inc.
0 cites
US121414432024
Dynamic Temperature Compensation in a Memory Component
0 cites
US121255392024
Adjustment of a Starting Voltage Corresponding to a Program Operation in a Memory Sub-system
Micron Technology, Inc.
0 cites
US120400262024
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US120012862024
Memory Device with Dynamic Processing Level Calibration
Micron Technology, Inc.
0 cites
US119830652024
Logic Based Read Sample Offset in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119539802024
Memory Sub-system with Dynamic Calibration Using Component-based Function(s)
Micron Technology, Inc.
0 cites
US119551942024
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US119346662024
Memory Device with Dynamic Program-verify Voltage Calibration
Micron Technology, Inc.
0 cites
US119085362024
First-pass Continuous Read Level Calibration
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118876762024
Adjusting Program Effective Time Using Program Step Characteristics
Micron Technology, Inc.
0 cites
US118622742024
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US118535562023
Combining Sets of Memory Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US118420612023
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US118427722023
Voltage Bin Boundary Calibration at Memory Device Power Up
Micron Technology, Inc.
0 cites
US118363452023
Memory Element Profiling and Operational Adjustments
Micron Technology, Inc.
0 cites
US118171522023
Generating Embedded Data in Memory Cells in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117896402023
Estimation of Read Level Thresholds Using a Data Structure
Micron Technology, Inc.
0 cites
US117910042023
Threshold Voltage Offset Bin Selection Based on Die Family in Memory Devices
Micron Technology, Inc.
0 cites
US117480082023
Changing of Memory Components to Be Used for a Stripe Based on an Endurance Condition
Micron Technology, Inc.
0 cites
US117420272023
Dynamic Program Erase Targeting with Bit Error Rate
Micron Technology, Inc.
0 cites
US117339282023
Read Sample Offset Bit Determination in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117279942023
Performing Threshold Voltage Offset Bin Selection by Package for Memory Devices
Micron Technology, Inc.
0 cites
US117145802023
Dynamic Background Scan Optimization in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117147092023
Enhanced Block Management for a Memory Subsystem
Micron Technology, Inc.
0 cites
US117155302023
Offset Memory Component Automatic Calibration (autocal) Error Recovery for a Memory Sub-system
Micron Technology, Inc.
0 cites
US117097752023
Write Data for Bin Resynchronization After Power Loss
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US117052082023
Read Level Calibration in Memory Devices Using Embedded Servo Cells
Micron Technology, Inc.
0 cites
US117052152023
Memory Sub-system with Background Scan and Histogram Statistics
Micron Technology, Inc.
0 cites
US116937452023
Error-handling Flows in Memory Devices Based on Bins
Micron Technology, Inc.
0 cites
US116755092023
Multiple Open Block Families Supporting Multiple Cursors of a Memory Device
Micron Technology, Inc.
0 cites
US116755112023
Associating Multiple Cursors with Block Family of Memory Device
Micron Technology, Inc.
0 cites
US116693802023
Dynamic Programming of Page Margins
Micron Technology, Inc.
0 cites
US116693982023
Memory Components with Ordered Sweep Error Recovery
Micron Technology, Inc.
0 cites
US116518282023
First-pass Dynamic Program Targeting (DPT)
Micron Technology, Inc.
0 cites
US116369132023
Tracking and Refreshing State Metrics in Memory Sub-systems
Micron Technology, Inc.
0 cites
US116097062023
Read Sample Offset Placement
Micron Technology, Inc.
0 cites
US116003332023
Adjustment of a Voltage Corresponding to a Programming Distribution Based on a Program Targeting Rule
Micron Technology, Inc.
0 cites
US116003542023
Determination of State Metrics of Memory Sub-systems Following Power Events
Micron Technology, Inc.
0 cites
US115799612023
Bit Error Rate Based Dynamic Program Step Characteristic Adjustment
Micron Technology, Inc.
0 cites
US115737202023
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US115452272023
Threshold Voltage Offset Bin Selection Based on Die Family in Memory Devices
MICRON TECHNOLOGY, Inc.
0 cites