Patents/Inventors

Brian Duffy

San Jose, CAUS4 patents

4 Patents

US124808902025
Deep Learning Based Mode Selection for Inspection
KLA CORPORATION
0 cites
US119226192024
Context-based Defect Inspection
KLA Corporation
0 cites
US117692422023
Mode Selection and Defect Detection Training
KLA Corporation
0 cites
US115803752023
Accelerated Training of a Machine Learning Based Model for Semiconductor Applications
Kla-tencor Corp.
0 cites