Patents/Inventors

Branislav Straka

BrnoCZ3 patents

3 Patents

US126075792026
Method and System for Orientating a Sample for Inspection with Charged Particle Microscopy
FEI Company
0 cites
US125801502026
Systems and Methods for Analyzing a Sample Using Charged Particle Beams and Active Pixel Control Sensors
FEI Company
0 cites
US124760742025
Charged Particle Sensors Including Wide Bandgap Materials
FEI COMPANY
0 cites