Patents/Inventors

Boris Sherman

RehovotIL6 patents

5 Patents

US125730242026
Image Augmentation for Machine Learning Based Defect Examination
Applied Materials Israel Ltd.
0 cites
US125307642026
Matching Based Defect Examination for Semiconductor Specimens
Applied Materials Israel Ltd.
0 cites
US124238002025
Machine Learning Based Defect Examination for Semiconductor Specimens
Applied Materials Israel Ltd.
0 cites
US124003192025
Defect Examination on a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US121528692024
Monitoring System and Method for Verifying Measurements in Patterned Structures
NOVA Ltd.
0 cites