Patents/Inventors

Boguslaw A. Swedek

Morgan Hill, CAUS14 patents

15 Patents

US124916032025
Passive Acoustic Monitoring and Acoustic Sensors for Chemical Mechanical Polishing
Applied Materials, Inc.
0 cites
US124475772025
Polishing Apparatus Using Neural Network for Monitoring
Applied Materials, Inc.
0 cites
US123208832025
Resistivity-based Adjustment of Thresholds for In-situ Monitoring
Applied Materials, Inc.
0 cites
US122576652025
Machine Vision as Input to a CMP Process Control Algorithm
Applied Materials, Inc.
0 cites
US121031352024
Core Configuration for In-situ Electromagnetic Induction Monitoring System
Applied Materials, Inc.
0 cites
US117742352023
Grouping Spectral Data from Polishing Substrates
Applied Materials, Inc.
0 cites
US117761092023
Thickness Measurement of Substrate Using Color Metrology
Applied Materials, Inc.
0 cites
US117151932023
Color Imaging for CMP Monitoring
Applied Materials, Inc.
0 cites
US117156722023
Endpoint Detection for Chemical Mechanical Polishing Based on Spectrometry
Applied Materials, Inc.
0 cites
US117017492023
Monitoring of Vibrations During Chemical Mechanical Polishing
Applied Materials, Inc.
0 cites
US116995952023
Imaging for Monitoring Thickness in a Substrate Cleaning System
Applied Materials, Inc.
0 cites
US116912442023
Multi-toothed, Magnetically Controlled Retaining Ring
Applied Materials, Inc.
0 cites
US116389822023
Core Configuration for In-situ Electromagnetic Induction Monitoring System
Applied Materials, Inc.
0 cites
US115773562023
Machine Vision as Input to a CMP Process Control Algorithm
Applied Materials, Inc.
0 cites
US115570482023
Thickness Measurement of Substrate Using Color Metrology
Applied Materials, Inc.
0 cites