2 Patents
- US121242482024Method and Apparatus for Processing Accelerated Test Data Based on Multiple Performance Degradation, and Computer Device
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE
0 cites - US120795502024Wiener Process-based Method and Device for Processing Accelerated Degradation Testing Data
China Electronic Product Reliability And Environmental Testing Research Institute (The Fifth Electronic Research Institute Of Ministry Of Industry And Information Technology) (CEPREI)
0 cites