Patents/Inventors

Bobin Mathew Skaria

BangaloreIN2 patents

3 Patents

US124890202025
End-to-end Measurement for Semiconductor Specimens
Applied Materials Israel Ltd.
0 cites
US119958482024
Image Generation for Examination of a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US118287142023
Image Acquisition by an Electron Beam Examination Tool for Metrology Measurement
Applied Materials Israel Ltd.
0 cites