Patents/Inventors

Boaz Ophir

HaifaIL3 patents

3 Patents

US125357442026
Overlay Estimation Based on Optical Inspection and Machine Learning
KLA Corporation
0 cites
US124238032025
Predicting Tool Induced Shift Using Moiré Overlay Targets
KLA Con
0 cites
US117834662023
Machine Learning for Metrology Measurements
KLA CORPORATION
0 cites