9 Patents
- US124983332025Defect Offset Correction for Examination of Semiconductor Specimens
Applied Materials Israel Ltd.
0 cites - 0 cites
- US123615312025Machine Learning-based Classification of Defects in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites - US121830662024Method of Deep Learning-based Examination of a Semiconductor Specimen and System Thereof
Applied Materials Israel Ltd.
0 cites - 0 cites
- US119403902024Selecting a Representative Subset of Potential Defects to Improve Defect Classifier Training and Estimation of Expected Defects of Interest
Applied Materials Israel Ltd.
0 cites - US117905152023Detecting Defects in Semiconductor Specimens Using Weak Labeling
Applied Materials Israel Ltd.
0 cites - 0 cites
- US115685312023Method of Deep Learning-based Examination of a Semiconductor Specimen and System Thereof
Applied Materials Israel Ltd.
0 cites