Bo-you Chen

3 Patents

• US125503372026

  Metal Halide Resistive Memory Device and Method for Forming the Same

  NATIONAL TAIWAN UNIVERSITY

  0 cites
• US123457602025

  Apparatus for Probing Device-under-test

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US118219422023

  Apparatus and Method for Probing Device-under-test

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites