Patents/Inventors

Bo Lei

San Jose, CAUS34 patents

30 Patents

US126204502026
Aborted Operation Detection for Nonvolatile Memory with Non-uniform Erase
Sandisk Technologies, Inc.
0 cites
US124942562025
Adaptive Erase Scheme for a Memory Device
Sandisk Technologies, Inc.
0 cites
US124844862025
Plant Growth Light and Plant Growing Shed
Shenzhen Guanke Technologies Co., Ltd
0 cites
US124650392025
Insect Trapping Device
SHENZHEN GUANKE TECHNOLOGIES CO., Ltd
0 cites
US124007192025
Non-volatile Memory with Overdrive Voltage Zoning to Compensate for Reduced Margins
Sandisk Technologies, Inc.
0 cites
US123702822025
Ventilation-type UV Light
SHENZHEN GUANKE TECHNOLOGIES CO., Ltd
0 cites
US123679372025
Binary Read-based Fast Algorithm for Optimal Read Level Acquisition
SANDISK TECHNOLOGIES, Inc.
0 cites
US123546832025
Non-volatile Memory with Erase Depth Detection and Adaptive Adjustment to Programming
Sandisk Technologies, Inc.
0 cites
USD10800392025
Grating Plate
Shenzhen Guanke Technologies Co., Ltd
0 cites
US122879742025
Adaptive Single-side Erase to Improve Cell Reliability
Sandisk Technologies, Inc.
0 cites
USD10643702025
Down Lamp
Shenzhen Guanke Technologies Co., Ltd
0 cites
US121987692025
Smart Early Detection of Wordline-memory Hole Defects with Wordline-dependent Dual Sensing During Erase Verify
Sandisk Technologies LLC
0 cites
US121710502024
Power Regulating Device and Light
SHENZHEN GUANKE TECHNOLOGIES CO., Ltd
0 cites
US121255372024
Variable Programming Voltage Step Size Control During Programming of a Memory Device
Sandisk Technologies LLC
0 cites
US120727052024
Intelligent Decision-making Method and System for Unmanned Surface Vehicle
CENTRAL CHINA OPTOELECTRONIC TECHNOLOGY RESEARCH INSTITUTE
0 cites
US120571692024
Techniques for Reading Memory Cells in a Memory Device During a Multi-pass Programming Operation
Sandisk Technologies LLC
0 cites
US120462972024
Method to Optimize First Read Versus Second Read Margin by Switching Boost Timing
Sandisk Technologies LLC
0 cites
US120462792024
Multi-pass Programming Operation Sequence in a Memory Device
Sandisk Technologies LLC
0 cites
US120010322024
Grating Structure and UV Light
Shenzhen Guanke Technologies Co., Ltd
0 cites
US119728142024
Verify Techniques for Current Reduction in a Memory Device
Sandisk Technologies, LLC
0 cites
US118427752023
Systems and Methods for Dynamically Sensing a Memory Block
Sandisk Technologies LLC
0 cites
USD10034852023
Straight-tube UV Light
Shenzhen Guanke Technologies Co., Ltd
0 cites
US117779742023
Systems Data Availability Validation
Splunk Inc.
0 cites
US117674032023
Method for Controlling Thermoplasticity and Toughness of Redox-modified Plant Fiber and Use Thereof
SOUTH CHINA UNIVERSITY OF TECHNOLOGY
0 cites
USD09974242023
Straight-tube UV Light
Shenzhen Guanke Technologies Co., Ltd
0 cites
US117352732023
Data Storage Systems and Methods for Improved Recovery After a Write Abort Event
Western Digital Technologies, Inc.
0 cites
US117052062023
Modifying Program and Erase Parameters for Single-bit Memory Cells to Improve Single-bit/multi-bit Hybrid Ratio
Sandisk Technologies LLC
0 cites
US116903332023
System and Method for Optimal Allocation of Agricultural Water Based on Water Consumption Control
China Institute Of Water Resources And Hydropower Research
0 cites
US116817072023
Analytics Query Response Transmission
SPLUNK Inc.
0 cites
US116261602023
Dynamic Sense Node Voltage to Compensate for Variances When Sensing Threshold Voltages of Memory Cells
Sandisk Technologies LLC
0 cites