Patents/Inventors

Bo-ching He

HsinchuTW2 patents

3 Patents

US121888832025
X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites
US118675952024
X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites
US115790992023
X-ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites