Patents/Inventors

Blake Erickson

Gilroy, CAUS15 patents

14 Patents

US124890222025
In-situ Etch Rate and Etch Rate Uniformity Detection System
Applied Materials, Inc.
0 cites
US124324612025
Smart Camera Substrate
Applied Materials, Inc.
0 cites
US124051642025
Spatial Optical Emission Spectroscopy for Etch Uniformity
Applied Materials, Inc.
0 cites
US122835032025
Substrate Measurement Subsystem
Applied Materials, Inc.
0 cites
US121911762025
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US121365572024
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US121140832024
Smart Camera Substrate
Applied Materials, Inc.
0 cites
US119275432024
Multiple Reflectometry for Measuring Etch Parameters
Applied Materials, Inc.
0 cites
US118307792023
In-situ Etch Material Selectivity Detection System
APPLIED MATERIALS, Inc.
0 cites
US117368182023
Smart Camera Substrate
Applied Materials, Inc.
0 cites
US116886162023
Integrated Substrate Measurement System to Improve Manufacturing Process Performance
Applied Materials, Inc.
0 cites
US116686022023
Spatial Optical Emission Spectroscopy for Etch Uniformity
Applied Materials, Inc.
0 cites
US116195942023
Multiple Reflectometry for Measuring Etch Parameters
Applied Materials, Inc.
0 cites
USD09775042023
Portion of a Display Panel with a Graphical User Interface
Applied Materials, Inc.
0 cites