Bing-yue Tsui

6 Patents

• US126131682026

  Method of Identifying Defects in Crystals

  Globalwafers Co., Ltd.

  0 cites
• US125882642026

  Three-dimensional Source Contact Structure and Fabrication Process Method of Making the Same

  NATIONAL YANG MING CHIAO TUNG UNIVERSITY

  0 cites
• US125074362025

  Gate Fabrication Method of an U-metal-oxide-semiconductor Field-effect Transistor and Trench Gate Structure Formed Thereof

  NATIONAL YANG MING CHIAO TUNG UNIVERSITY

  0 cites
• US124630392025

  Method for Reducing Parasitic Junction Field Effect Transistor Resistance

  NATIONAL YANG MING CHIAO TUNG UNIVERSITY

  0 cites
• US124083722025

  Process Method for Fabricating a Three-dimensional Source Contact Structure

  NATIONAL YANG MING CHIAO TUNG UNIVERSITY

  0 cites
• US122565592025

  Source-body Self-aligned Method of a Vertical Double Diffused Metal Oxide Semiconductor Field Effect Transistor

  NATIONAL YANG MING CHIAO TUNG UNIVERSITY

  0 cites