5 Patents
- US122982612025Backscatter Imaging Device, Control Method and Inspection System
NUCTECH COMPANY LIMITED
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- US116992232023Image Data Processing Method, Device and Security Inspection System Based on VR or AR
Tsinghua University
0 cites - US116195992023Substance Identification Device and Method for Extracting Statistical Feature Based on Cluster Analysis
Nuctech Company Limited
0 cites - 0 cites