6 Patents
- US125849612026Built-in Self Test Circuit for Segmented Static Random Access Memory (SRAM) Array Input/output
Stmicroelectronics International N.V.
0 cites - US124378252025At-speed Transition Fault Testing for a Multi-port and Multi-clock Memory
Stmicroelectronics International N.V.
0 cites - US123533412025Tuning of Read/write Cycle Time Delay for a Memory Circuit Dependent on Operational Mode Selection
Stmicroelectronics International N.V.
0 cites - US121701202024Built-in Self Test Circuit for Segmented Static Random Access Memory (SRAM) Array Input/output
Stmicroelectronics International N.V.
0 cites - 0 cites
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