36 Patents
- US125990322026Bilayer Memory Stacking with Lines Shared Between Bottom and Top Memory Layers
Intel Corporation
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- US124904602025Dielectric Sidewall Features for Tuning Thin Film Transistor (TFT) Parasitics
Intel Corporation
0 cites - US124713182025Low Defect, High Mobility Thin Film Transistors with In-situ Doped Metal Oxide Channel Material
Intel Corporation
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- US122059472025Planar Buried Channel Structure Integrated with Non-planar Structures
Intel Corporation
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- US121502972024Thin Film Transistors Having a Backside Channel Contact for High Density Memory
Intel Corporation
0 cites - US121425662024Method of Forming Stacked Trench Contacts and Structures Formed Thereby
Intel Corporation
0 cites - US120806432024Integrated Circuit Structures Having Differentiated Interconnect Lines in a Same Dielectric Layer
Intel Corporation
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- US120150872024Semiconductor Device Having a Necked Semiconductor Body and Method of Forming Semiconductor Bodies of Varying Width
Intel Corporation
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- US119731052024Embedded Precision Resistor for Non-planar Semiconductor Device Architectures
Intel Corporation
0 cites - US119555602024Passivation Layers for Thin Film Transistors and Methods of Fabrication
Intel Corporation
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- US119294152024Thin Film Transistors with Offset Source and Drain Structures and Process for Forming Such
Intel Corporation
0 cites - US119089112024Thin Film Transistors with Raised Source and Drain Contacts and Process for Forming Such
Intel Corporation
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- US117840882023Isolation Gap Filling Process for Embedded Dram Using Spacer Material
Intel Corporation
0 cites - US117842572023Semiconductor Device Having a Necked Semiconductor Body and Method of Forming Semiconductor Bodies of Varying Width
Intel Corporation
0 cites - US117587112023Thin-film Transistor Embedded Dynamic Random-access Memory with Shallow Bitline
Intel Corporation
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- US117216302023Method of Forming Stacked Trench Contacts and Structures Formed Thereby
Intel Corporation
0 cites - US116902112023Thin Film Transistor Based Memory Cells on Both Sides of a Layer of Logic Devices
Intel Corporation
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- US115631072023Method of Contact Patterning of Thin Film Transistors for Embedded DRAM Using a Multi-layer Hardmask
Intel Corporation
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