Bernhard Schüler

3 Patents

• US125623362026

  Method of Imaging a Sample with a Charged Particle Beam Device, Method of Calibrating a Charged Particle Beam Device, and Charged Particle Beam Device

  Applied Materials, Inc.

  0 cites
• US116870082023

  Method for Automated Critical Dimension Measurement on a Substrate for Display Manufacturing, Method of Inspecting a Large Area Substrate for Display Manufacturing, Apparatus for Inspecting a Large Area Substrate for Display Manufacturing and Method of Operating Thereof

  APPLIED MATERIALS, Inc.

  0 cites
• US116107552023

  Method of Automatically Focusing a Charged Particle Beam on a Surface Region of a Sample, Method of Calculating a Converging Set of Sharpness Values of Images of a Charged Particle Beam Device and Charged Particle Beam Device for Imaging a Sample

  Applied Materials, Inc.

  0 cites