Benjamin John Cook

2 Patents

• US123621312025

  Method for Inspecting a Specimen and Charged Particle Beam Device

  TECHNISCHE UNIVERSITEIT DELFT

  0 cites
• US117053012023

  Charged Particle Beam Manipulation Device and Method for Manipulating Charged Particle Beamlets

  ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh

  0 cites