3 Patents
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- US123549522025Integrated Circuits (ics) Employing Multi-pattern Metallization to Optimize Metal Interconnect Spacing for Improved Performance and Related Fabrication Methods
QUALCOMM Incorporated
0 cites - US116582502023Metal-oxide Semiconductor (MOS) Capacitor (MOSCAP) Circuits and MOS Device Array Bulk Tie Cells for Increasing MOS Device Array Density
QUALCOMM Incorporated
0 cites