Patents/Inventors

Bart Jozef Janssen

EindhovenNL7 patents

8 Patents

US121658352024
Stroboscopic Illumination Synchronized Electron Detection and Imaging
FEI Company
0 cites
US120740072024
Rotating Sample Holder for Random Angle Sampling in Tomography
FEI Company
0 cites
US120091762024
Method and System for Generating a Diffraction Image
FEI Company
0 cites
US119903152024
Measurement and Correction of Optical Aberrations in Charged Particle Beam Microscopy
FEI Company
0 cites
US117567622023
Rotating Sample Holder for Random Angle Sampling in Tomography
FEI Company
0 cites
US117421752023
Defective Pixel Management in Charged Particle Microscopy
FEI Company
0 cites
US116948742023
Method and System for Generating a Diffraction Image
FEI Company
0 cites
US115519062023
Time-gated Detection, Dual-layer Spad-based Electron Detection
FEI Company
0 cites