Patents/Inventors

Bart Buijsse

EindhovenNL5 patents

5 Patents

US123061192025
Methods and Systems for Determining the Absolute Structure of Crystal
FEI Company
0 cites
US120091762024
Method and System for Generating a Diffraction Image
FEI Company
0 cites
US119886182024
Method and System to Determine Crystal Structure
FEI Company
0 cites
US118154762023
Methods and Systems for Acquiring Three-dimensional Electron Diffraction Data
FEI Company
0 cites
US116948742023
Method and System for Generating a Diffraction Image
FEI Company
0 cites