Patents/Inventors

Barak Bringoltz

RehovotIL8 patents

8 Patents

US125470822026
Combining Physical Modeling and Machine Learning
Nova Ltd.
0 cites
US123211022025
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites
US122363642025
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US120382712024
Detecting Outliers and Anomalies for OCD Metrology Machine Learning
NOVA Ltd
0 cites
US118746062024
System and Method for Controlling Measurements of Sample's Parameters
NOVA Ltd.
0 cites
US118625222024
Accuracy Improvements in Optical Metrology
0 cites
US118158192023
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites
US117631812023
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites