Patents/Inventors

Baek Young Lee

SeoulKR1 patent

2 Patents

US118165792023
Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning
SAMSUNG SDS CO., Ltd.
0 cites
US115872222023
Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning
SAMSUNG SDS CO., Ltd.
0 cites